Bio
Dr. Sieg is a highly educated and experienced attorney with an extensive background in patent prosecution in diverse areas such as: semiconductor, optoelectronics, and microelectronics devices and manufacturing; medical imaging; illumination systems; biomedical sciences; nuclear power systems; steam generators; and computer software systems; among others, for clients including international corporations and leading academic institutions. He also has extensive experience advising foreign associates in prosecution of counterpart patent applications in Europe, Taiwan, China, Japan, and other countries.
Prior to entering his legal career, Dr. Sieg engaged in academic and governmental research in the field of semiconductor device fabrication and characterization. His accomplishments have included: development of InGaAsN-based 1.3 µm VCSELs for fiber optic communications at Sandia National Laboratories in Albuquerque, NM; development of new epitaxial techniques for integrating GaAs-based optoelectronics with silicon microelectronics at The Ohio State University; and modeling and analysis of thin-film optoelectronic structures by spectroscopic ellipsometry at NASA Lewis (now Glenn) Research Center in Cleveland, Ohio. Dr. Sieg has co-authored nearly two dozen archival journal articles published in the Journal of Applied Physics, Applied Physics Letters, Journal of Vacuum Science and Technology, and the Journal of Crystal Growth, among others, as well as co-authoring numerous refereed presentations/proceedings at various national/international conferences.
Prior to entering his legal career, Dr. Sieg engaged in academic and governmental research in the field of semiconductor device fabrication and characterization. His accomplishments have included: development of InGaAsN-based 1.3 µm VCSELs for fiber optic communications at Sandia National Laboratories in Albuquerque, NM; development of new epitaxial techniques for integrating GaAs-based optoelectronics with silicon microelectronics at The Ohio State University; and modeling and analysis of thin-film optoelectronic structures by spectroscopic ellipsometry at NASA Lewis (now Glenn) Research Center in Cleveland, Ohio. Dr. Sieg has co-authored nearly two dozen archival journal articles published in the Journal of Applied Physics, Applied Physics Letters, Journal of Vacuum Science and Technology, and the Journal of Crystal Growth, among others, as well as co-authoring numerous refereed presentations/proceedings at various national/international conferences.
